Directory Sites

  • Molecular Metrology, Inc.

    Designs and manufactures x-ray scattering equipment, including complete instruments for small angle mode and two dimensional detectors. Includes specifications of systems and components, at Northampton, Massachusetts.

    www.molmet.com

  • Area Detector Systems Corporation

    Manufacturer of CCD detectors, particularly in the X-ray range. Includes specifications, certification and technical support from Poway, California.

    www.adsc-xray.com

  • Oxford Microbeams Ltd.

    Non-destructive, trace elemental analysis, ion beam analysis using a focused microbeam. Includes applications in tomography and microfabrication, downloads and contacts in England.

    www.microbeams.co.uk

  • Physical Electronics, Inc.

    Surface analysis instrumentation, including: AES, ESCA, TOF-SIMS and D-SIMS based instrumentation.

    www.phi.com

  • Axic, Inc.

    Manufactures and distributes semiconductor plasma processing equipment and thin film metrology tools for the semiconductor, III-V compound semiconductor, optics, photonics, optoelectronics, nanotechnology and micro electromechanical system (MEMS) industries. Includes product overview, contacts for technical support, worldwide distribution and location map of Santa Clara, California.

    www.axic.com

  • Innova Air Tech Instruments A/S

    Manufacturing systems for measurements in anaesthetic gas monitoring, fermentation monitoring, tracer gas, photoacoustic, ventilation and thermal comfort. Includes applications, publications, distribution from Ballerup, Denmark.

    www.innova-airtech.com

  • Dacell Co., Ltd.

    Manufactures load cell, torque sensor, pressure sensor, torque wrench, LVDT, multi-layer inclinometer and digital indicator in Chung-Buk, Korea.

    www.danaloadcell.com

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