Electrochemical migration
From Wikipedia, the free encyclopedia
Electrochemical migration (ECM) is the growth of conductive metal filaments on or in a printed circuit board (PCB) under the influence of a DC voltage bias.
[1] IPC Publication IPC-TR-476A, “Electrochemical Migration: Electrically Induced Failures in Printed Wiring Assemblies,” Northbrook, IL, May 1997.
[2] S.Zhan, M. H. Azarian and M. Pecht, "Reliability Issues of No-Clean Flux Technology with Lead-free Solder Alloy for High Density Printed Circuit Boards", 38th International Symposium on Microelectronics, pp. 367-375, Philadelphia, PA, September 25-29, 2005.